Use when bare cell contact thickness maps are about to be accepted as qualification evidence of metallisation evenness. Assess whether the metallisation on a bare solar cell contact is laid to an even depth under ECSS-E-ST-20-08C clause 7.5.9: order a mapped set of thickness readings along one contact feature, refuse a map too sparse or too clustered to speak for the feature, reduce it to mean, range, coefficient of variation and a thinnest-to-thickest uniformity ratio, fit a slope along the ...
Scanned 9/27/2026
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---
name: e2008-cell-contact-uniformity-test
description: "Use when bare cell contact thickness maps are about to be accepted as qualification evidence of metallisation evenness. Assess whether the metallisation on a bare solar cell contact is laid to an even depth under ECSS-E-ST-20-08C clause 7.5.9: order a mapped set of thickness readings along one contact feature, refuse a map too sparse or too clustered to speak for the feature, reduce it to mean, range, coefficient of variation and a thinnest-to-thickest uniformity ratio, fit a slope along the feature to separate a plating gradient from random scatter or one thin spot, and roll the mapped features into a cell verdict. Trigger: ecss, e-st-20-08c-clause-7-5-9, bare-cell-contact-metallisation-uniformity, solar-cell-contact-thickness-map, contact-plating-thickness-gradient, cell-metallisation-uniformity-ratio, contact-thickness-coefficient-of-variation, bare-cell-grid-finger-thickness-spread."
license: Apache-2.0
compliance: STANDARDS-REF
standards:
- id: ecss
reference-only: true
gated: false
domain: space-systems
pack: space-systems
compatibility: "agentskills.io SKILL.md; any SKILL.md host (Claude Code, Hermes, OpenClaw)"
metadata:
domain: space-systems
subdomain: ecss
tags: [ecss, e-st-20-08-solar-cell-scope, e-st-20-08c-clause-7-5-9, e2008-cell-contact-uniformity-test, bare-cell-contact-metallisation-uniformity, solar-cell-contact-thickness-map, contact-plating-thickness-gradient, cell-metallisation-uniformity-ratio, contact-thickness-coefficient-of-variation, bare-cell-grid-finger-thickness-spread]
version: 0.1.0
author: Aero Agent Skills
---
# ECSS Solar Cells -- Cell Contact Uniformity Test (space-systems/ecss/e2008-cell-contact-uniformity-test)
Use when the task is clause 7.5.9 of ECSS-E-ST-20-08C -- the
qualification measurement that confirms the metallisation deposited on
the contacts of a bare solar cell sits at an even depth everywhere it
was laid down. The clause is about evenness across one contact, not
about whether the contact is thick enough; that second question belongs
to the acceptance thickness measurement and is a different limit set.
## Domain quick reference
- The measurement is a map, not a reading. Thickness is taken at known
positions along a contact feature -- a grid finger, a front or rear
bus bar, the rear metallisation -- and the position is carried with
the value because every useful conclusion is about how the value
moves along the feature.
- A map that does not reach both ends of the feature describes the part
of the contact it covers and nothing else. Six readings clustered in
the first ten millimetres of a fifty millimetre bus bar return a
flattering spread and say nothing about the far end, so the span the
readings cover is checked against the feature length before any
spread figure is trusted.
- Spread is reported three ways because a limit can be written against
any of them: the coefficient of variation for the population, the
thinnest-to-thickest uniformity ratio for the extremes, and the worst
single departure from the mean for the one bad spot.
- The same coefficient of variation arrives from three different
process faults. A mask or bath that drifted along the cell produces a
gradient, agitation noise produces scatter, and a blocked nozzle
produces one reading off an otherwise flat surface. Naming which one
is present is what makes the result actionable on the line.
- A least-squares slope along the feature separates the first from the
other two, and it is the end-to-end drift as a fraction of the mean
that is compared, never the bare slope: half a micrometre per
millimetre is nothing on a finger and severe on a bus bar.
- An outlier inflates any scale computed from a set it belongs to. At
the handful of points this measurement runs at, the residual spread
including the outlier is large enough to hide it from every
threshold, so the scale is taken from the residuals with the largest
one dropped.
- Two readings at the same position are a transcription fault rather
than a repeat. They leave the position axis degenerate and no slope
can be fitted through them.
## Workflow
1. Take the readings for one contact feature at a time and name the
feature. A cell rolls up from its features; a spread figure that
mixes a grid finger with a bus bar belongs to neither.
2. Order and validate the map: positions distinct and inside the
declared feature length, thicknesses positive and finite. Refuse a
bad map rather than flagging it, because every figure below it
inherits the fault silently.
3. Check the map speaks for the feature -- enough points, and a span
wide enough against the feature length -- and stop there if it does
not. An inadequate map is neither a pass nor a fail and must not be
reported as either.
4. Reduce to mean, range, coefficient of variation, uniformity ratio
and the worst single departure, and compare each against its
declared limit.
5. Fit the slope, normalise it to end-to-end drift over the mean, and
name the dominant mode: a gradient, one outlier against a trimmed
residual scale, or scatter.
6. Roll the features into a cell verdict where an inadequate map
outranks a non-uniform one, since the second is a measured result
and the first is an absence of one.
## Pitfalls
- Reading an average thickness as evidence of uniformity. The average
of a contact thick at one end and thin at the other is exactly the
average of an even one, which is the failure this clause exists to
catch.
- Accepting a map clustered at one end. It returns a small spread
honestly computed over the part of the contact it saw, and the
reported figure carries no trace of the part it did not.
- Comparing a bare slope against a limit. The same micrometres per
millimetre is negligible across a short finger and disqualifying
across a long bus bar, so the drift is normalised over the feature
before it is judged.
- Taking the outlier threshold against a residual scale the outlier is
inside. At six points the inflated scale caps the achievable ratio
below any sensible threshold, so a single thin spot is reported as
ordinary scatter.
- Treating an inadequate map as a fail. It sends a good cell to scrap
and it hides the real defect, which is the measurement plan.
- Clamping the fitted slope to a magnitude. The sign says which end of
the cell ran thin, and that is the half of the result the plating
line acts on.
## Behavior contract (gate 3)
Map ordering and validation, sample adequacy against feature length,
the spread statistics, signed point deviations, the least-squares
gradient with its plain and trimmed residual scales, the dominant
non-uniformity mode and the per-feature and per-cell verdicts are
exercised by the gate 3 contract test:
scripts/test_e2008_cell_contact_uniformity_test.py against
scripts/e2008_cell_contact_uniformity_test_logic.py (stdlib unittest,
offline). Run:
python3 scripts/test_e2008_cell_contact_uniformity_test.py
## Compliance
- ECSS standards are freely downloadable (ESA); cite the source and
paraphrase per standards-map.yaml.
- compliance: STANDARDS-REF, gated: false.
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